Microstructural, chemical states and electrical properties of Au/CuO/n-InP heterojunction with a cupric oxide interlayer

Autor: Balaram, N., Rajagopal Reddy, V., Sekhar Reddy, P.R., Janardhanam, V., Choi, Chel-Jong
Zdroj: In Vacuum June 2018 152:15-24
Databáze: ScienceDirect