Dielectric substrate self-bias and plasma confinement in two-dimensional scanning radio frequency plasma-enhanced chemical vapour deposition

Autor: Yin, Y., Pan, Y.Q., Hang, L., Bilek, M.M.M., McKenzie, D., Rubanov, S.
Zdroj: In Vacuum 2006 81(4):441-445
Databáze: ScienceDirect