Effect of enhanced pressure during annealing on the creation of defects in electron-irradiated silicon
Autor: | Misiuk, A. *, Surma, B., Bak-Misiuk, J., Antonova, I.V., Smagulova, S.A. |
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Zdroj: | In Vacuum 11 March 2005 77(4):513-517 |
Databáze: | ScienceDirect |
Externí odkaz: |