Electron scattering mechanisms in indium-tin-oxide thin films: grain boundary and ionized impurity scattering

Autor:	Lee, Ho-Chul *, Ok Park, O
Zdroj:	In Vacuum 2004 75(3):275-282
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect