IR and Raman absorption spectroscopic studies of APCVD, LPCVD and PECVD thin SiN films

Autor: Beshkov, G *, Lei, Shi, Lazarova, V, Nedev, N, Georgiev, S.S
Zdroj: In Vacuum 2002 69(1):301-305
Databáze: ScienceDirect