Optical and structural properties of dense SiO 2, Ta 2O 5 and Nb 2O 5 thin-films deposited by indirectly reactive sputtering technique

Autor: Song, Yizhou *, Sakurai, Takeshi, Maruta, Kazuhiko, Matusita, Akinori, Matsumoto, Shigeharu, Saisho, Shinichiro, Kikuchi, Kazuo
Zdroj: In Vacuum 2000 59(2):755-763
Databáze: ScienceDirect