Optical and structural properties of dense SiO 2, Ta 2O 5 and Nb 2O 5 thin-films deposited by indirectly reactive sputtering technique
Autor: | Song, Yizhou *, Sakurai, Takeshi, Maruta, Kazuhiko, Matusita, Akinori, Matsumoto, Shigeharu, Saisho, Shinichiro, Kikuchi, Kazuo |
---|---|
Zdroj: | In Vacuum 2000 59(2):755-763 |
Databáze: | ScienceDirect |
Externí odkaz: |