Probing the limits of full-field linear local defect resonance identification for deep defect detection
| Autor: | Segers, Joost, Hedayatrasa, Saeid, Poelman, Gaétan, Van Paepegem, Wim, Kersemans, Mathias |
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| Zdroj: | In Ultrasonics July 2020 105 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect