Effect of composition on thermal stability and electrical resistivity of Ta–Si–N films

Autor: Olowolafe, J.O *, Rau, I, Unruh, K.M, Swann, C.P, Jawad, Z.S, Alford, T
Zdroj: In Thin Solid Films 2000 365(1):19-21
Databáze: ScienceDirect