Infra-red reflectivity of ion-implanted and pulsed excimer laser irradiated 4H-SiC
| Autor: | Key, P.H., Sands, D. *, Schlaf, M., Walton, C.D., Anthony, C.J., Brunson, K.M., Uren, M.J. |
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| Zdroj: | In Thin Solid Films 27 March 2000 364(1-2):200-203 |
| Databáze: | ScienceDirect |
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