A PL study of CIGS thin films implanted with He and D ions

Autor: Yakushev, M.V. *, Martin, R.W., Krustok, J., Schock, H.W., Pilkington, R.D., Hill, A.E., Tomlinson, R.D.
Zdroj: In Thin Solid Films 21 February 2000 361-362:488-493
Databáze: ScienceDirect