Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution
| Autor: | Bilanych, V.S., Shylenko, O., Vorobiov, S., Soroka, S., Bilanych, V.V., Rizak, V., Lytvyn, P.M., Loya, V. Yu, Feher, A., Komanicky, V. |
|---|---|
| Zdroj: | In Thin Solid Films 30 January 2024 789 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect