Interface analysis of Mg/Sc and Sc/Mg bilayers using X-ray reflectivity

Autor: Verma, Hina, Guen, Karine Le, Gupta, Shruti, Dhawan, Rajnish, Modi, Mohammed H., Jonnard, Philippe
Zdroj: In Thin Solid Films 1 December 2022 763
Databáze: ScienceDirect