Interface analysis of Mg/Sc and Sc/Mg bilayers using X-ray reflectivity
Autor: | Verma, Hina, Guen, Karine Le, Gupta, Shruti, Dhawan, Rajnish, Modi, Mohammed H., Jonnard, Philippe |
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Zdroj: | In Thin Solid Films 1 December 2022 763 |
Databáze: | ScienceDirect |
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