The evolution of nanoscale pores with post-annealing and the structure-electrical property correlation in vanadium oxide thin films

Autor: Dirican, Emrah, Yağcı, Ahmet Murat, Tanrıkulu, Mahmud Yusuf, Öksüzoğlu, Ramis Mustafa
Zdroj: In Thin Solid Films 28 February 2022 744
Databáze: ScienceDirect