Effects of electron beam irradiation on a Ag/AsS2 bilayer using conductive atomic force microscopy
| Autor: | Sniķeris, Jānis, Gerbreders, Vjaceslavs |
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| Zdroj: | In Thin Solid Films 1 August 2021 731 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Sniķeris, Jānis, Gerbreders, Vjaceslavs |
|---|---|
| Zdroj: | In Thin Solid Films 1 August 2021 731 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect