Interface formation in W/Si multilayers studied by Low Energy Ion Scattering
| Autor: | Zameshin, A.A., Medvedev, R.V., Yakshin, A.E., Bijkerk, F. |
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| Zdroj: | In Thin Solid Films 30 April 2021 724 |
| Databáze: | ScienceDirect |
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| Autor: | Zameshin, A.A., Medvedev, R.V., Yakshin, A.E., Bijkerk, F. |
|---|---|
| Zdroj: | In Thin Solid Films 30 April 2021 724 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect