Helium ion penetration in sputtering cathode materials: A crucial process for the helium treatment of oxide thin films

Autor: Wang, Haoru, Xie, Xiangnan, Lin, Guankai, Wang, Yongqiang, Tong, Wei, Zhu, Hong
Zdroj: In Thin Solid Films 1 November 2020 713
Databáze: ScienceDirect