Photoluminescence mapping of the strain induced in InP and GaAs substrates by SiNx stripes etched from thin films grown under controlled mechanical stress

Autor: Gérard, Solène, Mokhtari, Merwan, Landesman, Jean-Pierre, Levallois, Christophe, Fouchier, Marc, Pargon, Erwine, Pagnod-Rossiaux, Philippe, Laruelle, François, Moréac, Alain, Ahammou, Brahim, Cassidy, Daniel T.
Zdroj: In Thin Solid Films 31 July 2020 706
Databáze: ScienceDirect