Cross sectional complex structure analysis is a key issue of thin film research: A case study on the preferential orientation crossover in TiN thin films

Autor: Barna, P.B., Biro, D., Hasaneen, M.F., Székely, L., Menyhárd, M., Sulyok, A., Horváth, Z.E., Pekker, P., Dódony, I., Radnóczi, G.
Zdroj: In Thin Solid Films 31 October 2019 688
Databáze: ScienceDirect