Oxygen incorporated during deposition determines the crystallinity of magnetron-sputtered Ta3N5 films

Autor: Rudolph, M., Vickridge, I., Foy, E., Alvarez, J., Kleider, J.-P., Stanescu, D., Magnan, H., Herlin-Boime, N., Bouchet-Fabre, B., Minea, T., Hugon, M.-C.
Zdroj: In Thin Solid Films 1 September 2019 685:204-209
Databáze: ScienceDirect