Impact of silica-substrate chemistry on tantalum nitride thin films deposited by atomic layer deposition: Microstructure, chemistry and electrical behaviors

Autor: Volpi, Fabien, Cadix, Lionel, Berthomé, Gregory, Coindeau, Stéphane, Encinas, Thierry, Jourdan, Nicolas, Blanquet, Elisabeth
Zdroj: In Thin Solid Films 1 January 2019 669:392-398
Databáze: ScienceDirect