The influence on electrical characteristics of amorphous indium tungsten oxide thin film transistors with multi-stacked active layer structure

Autor: Ruan, Dun-Bao a, Liu, Po-Tsun b, ⁎, Gan, Kai-Jhih a, Chiu, Yu-Chuan b, Yu, Min-Chin b, Chien, Ta-Chun b, Chen, Yi-Heng b, Kuo, Po-Yi b, Sze, Simon M. a
Zdroj: In Thin Solid Films 30 November 2018 666:94-99
Databáze: ScienceDirect