Impact of a SiGe interfacial layer on the growth of a SiC layer on Si with voids at the interface

Autor: Juluri, Raghavendra Rao, Gaiduk, Peter, Hansen, John Lundsgaard, Larsen, Arne Nylandsted, Julsgaard, Brian
Zdroj: In Thin Solid Films 30 September 2018 662:103-109
Databáze: ScienceDirect