Nanostructural characterization of sputter deposited Ti-Nb coatings byautomated crystallographic orientation mapping
| Autor: | Gonzalez, E. David, Afonso, Conrado R.M., Nascente, Pedro A.P. |
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| Zdroj: | In Thin Solid Films 1 September 2018 661:92-97 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect