Excitation spectra of defect levels derived from photoinduced current transient spectroscopy — a tool for studying deep levels in Cu(In,Ga)Se2 compounds
| Autor: | Igalson, M., Macielak, K., Urbaniak, A., Barreau, N., Larsen, J. |
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| Zdroj: | In Thin Solid Films 1 July 2017 633:227-230 |
| Databáze: | ScienceDirect |
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