Resistivity of atomic layer deposition grown ZnO: The influence of deposition temperature and post-annealing

Autor: Laube, J., Nübling, D., Beh, H., Gutsch, S., Hiller, D., Zacharias, M.
Zdroj: In Thin Solid Films 31 March 2016 603:377-381
Databáze: ScienceDirect