Electrical transport properties of V2O5 thin films obtained by thermal annealing of layers grown by RF magnetron sputtering at room temperature

Autor: Giannetta, H.M.R., Calaza, C., Lamas, D.G., Fonseca, L., Fraigi, L.
Zdroj: In Thin Solid Films 31 August 2015 589:730-734
Databáze: ScienceDirect