Influence of Ti top electrode thickness on the resistive switching properties of forming free and self-rectified TiO2 − x thin films
Autor: | Bousoulas, P., Michelakaki, I., Tsoukalas, D. |
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Zdroj: | In Thin Solid Films 28 November 2014 571 Part 1:23-31 |
Databáze: | ScienceDirect |
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