Characterization of a-Si:H thin layers incorporated into textured a-Si:H/c-Si solar cell structures by spectroscopic ellipsometry using a tilt-angle optical configuration
| Autor: | Tanaka, Yoshikazu, Matsuki, Nobuyuki, Fujiwara, Hiroyuki |
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| Zdroj: | In Thin Solid Films 31 October 2014 569:64-69 |
| Databáze: | ScienceDirect |
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