Structural and optical properties of post-annealed atomic-layer-deposited HfO2 thin films on GaAs

Autor: Bennett, N.S., Cherkaoui, K., Wong, C.S., O'Connor, É., Monaghan, S., Hurley, P., Chauhan, L., McNally, P.J.
Zdroj: In Thin Solid Films 31 October 2014 569:104-112
Databáze: ScienceDirect