Effects of growth temperature on performance and stability of zinc oxide thin film transistors fabricated by thermal atomic layer deposition

Autor: Cho, Sung Woon, Ahn, Cheol Hyoun, Yun, Myeong Gu, Kim, So Hee, Cho, Hyung Koun
Zdroj: In Thin Solid Films 1 July 2014 562:597-602
Databáze: ScienceDirect