Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n–k plane
| Autor: | Urban, F.K., III ⁎, Barton, D. |
|---|---|
| Zdroj: | In Thin Solid Films 1 July 2014 562:49-55 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Urban, F.K., III ⁎, Barton, D. |
|---|---|
| Zdroj: | In Thin Solid Films 1 July 2014 562:49-55 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect