Effect of field cooling process and ion-beam bombardment on the exchange bias of NiCo/(Ni, Co)O bilayers
Autor: | Li, X., Lin, K.-W., Liu, H.-Y., Wei, D.-H., Li, G.J., Pong, P.W.T. |
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Zdroj: | In Thin Solid Films 3 November 2014 570 Part B:383-389 |
Databáze: | ScienceDirect |
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