Effect of field cooling process and ion-beam bombardment on the exchange bias of NiCo/(Ni, Co)O bilayers
| Autor: | Li, X., Lin, K.-W., Liu, H.-Y., Wei, D.-H., Li, G.J., Pong, P.W.T. |
|---|---|
| Zdroj: | In Thin Solid Films 3 November 2014 570 Part B:383-389 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect