Free-charge carrier parameters of n-type, p-type and compensated InN:Mg determined by infrared spectroscopic ellipsometry
| Autor: | Schöche, S., Hofmann, T., Darakchieva, V., Wang, X., Yoshikawa, A., Wang, K., Araki, T., Nanishi, Y., Schubert, M. |
|---|---|
| Zdroj: | In Thin Solid Films 28 November 2014 571 Part 3:384-388 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect