Lanthanum titanium perovskite compound: Thin film deposition and high frequency dielectric characterization

Autor: Le Paven, C., Lu, Y., Nguyen, H.V., Benzerga, R., Le Gendre, L., Rioual, S., Benzegoutta, D., Tessier, F., Cheviré, F., Sharaiha, A., Delaveaud, C., Castel, X.
Zdroj: In Thin Solid Films 28 February 2014 553:76-80
Databáze: ScienceDirect