Comparison of the structural properties and residual stress of AlN films deposited by dc magnetron sputtering and high power impulse magnetron sputtering at different working pressures

Autor: Ait Aissa, K., Achour, A., Camus, J., Le Brizoual, L., Jouan, P.-Y., Djouadi, M.-A.
Zdroj: In Thin Solid Films 1 January 2014 550:264-267
Databáze: ScienceDirect