Study of Al2O3 nanolayers synthesized onto porous SiO2 using X-ray reflection spectroscopy
| Autor: | Konashuk, A.S. a, Sokolov, A.A. a, Drozd, V.E. a, Schaefers, F. b, Filatova, E.O. a, ⁎ |
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| Zdroj: | In Thin Solid Films 1 May 2013 534:363-366 |
| Databáze: | ScienceDirect |
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