Nondestructive mapping of chemical composition and structural qualities of group III-nitride nanowires using submicron beam synchrotron-based X-ray diffraction
| Autor: | Bonanno, P.L., Gautier, S., Gmili, Y.El., Moudakir, T., Sirenko, A.A., Kazimirov, A., Cai, Z.-H., Martin, J., Goh, W.H., Martinez, A., Ramdane, A., Le Gratiet, L., Maloufi, N., Assouar, M.B., Ougazzaden, A. |
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| Zdroj: | In Thin Solid Films 31 August 2013 541:46-50 |
| Databáze: | ScienceDirect |
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