Synchrotron X-ray diffraction analysis for quantitative defect evaluation in GaP/Si nanolayers
| Autor: | Nguyen Thanh, T., Robert, C., Létoublon, A., Cornet, C., Quinci, T., Giudicelli, E., Almosni, S., Boudet, N., Ponchet, A., Kuyyalil, J., Danila, M., Durand, O., Bertru, N., Le Corre, A. |
|---|---|
| Zdroj: | In Thin Solid Films 31 August 2013 541:36-40 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect