Electrical property relaxation characteristics of UV-treated ZnO-based thin film transistors
| Autor: | Jin, Sun Moon, Cho, Nam-Ihn, Yun, Eui-Jung, Nam, Hyoung Gin |
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| Zdroj: | In Thin Solid Films 1 January 2013 527:334-337 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect