Preparation of resistance random access memory samples for in situ transmission electron microscopy experiments

Autor: Kudo, Masaki, Arita, Masashi, Ohno, Yuuki, Fujii, Takashi, Hamada, Kouichi, Takahashi, Yasuo
Zdroj: In Thin Solid Films 30 April 2013 533:48-53
Databáze: ScienceDirect