Studies on switching mechanisms in Pd-nanodot embedded Nb2O5 memristors using scanning tunneling microscopy

Autor: Hota, M.K., Bera, M.K., Verma, S., Maiti, C.K.
Zdroj: In Thin Solid Films 31 August 2012 520(21):6648-6652
Databáze: ScienceDirect