Comparative study of erbium disilicide thin films grown in situ under ultrahigh vacuum or ex situ with a capping layer
| Autor: | Reckinger, N., Duţu, C.A., Tang, X., Dubois, E., Yarekha, D.A., Godey, S., Nougaret, L., Łaszcz, A., Ratajczak, J., Raskin, J.-P. |
|---|---|
| Zdroj: | In Thin Solid Films 30 April 2012 520(13):4501-4505 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect