Temperature-driven local rearrangement in the Er environment of Er-doped silica glass films prepared by rf-cosputtering deposition

Autor: Gonella, F., Battaglin, G., Cattaruzza, E., Trave, E., Leto, A., Pezzotti, G.
Zdroj: In Thin Solid Films 1 May 2012 520(14):4758-4761
Databáze: ScienceDirect