Electrical characterization of wafer-bonded Ge(111)-on-insulator substrates using four-point-probe pseudo-metal-oxide-semiconductor field-effect transistor method
| Autor: | Minami, K., Nakamura, Y., Yamasaka, S., Yoshitake, O., Kikkawa, J., Izunome, K., Sakai, A. |
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| Zdroj: | In Thin Solid Films 1 February 2012 520(8):3232-3235 |
| Databáze: | ScienceDirect |
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