Faceting and nanostructure effects in Si and SiGe epitaxy

Autor: Dutartre, Didier, Seiss, Birgit, Campidelli, Yves, Pellissier-Tanon, Denis, Barge, David, Pantel, Roland
Zdroj: In Thin Solid Films 1 February 2012 520(8):3163-3169
Databáze: ScienceDirect