Effect of layer thickness on structural quality of Ge epilayers grown directly on Si(001)
| Autor: | Shah, V.A., Dobbie, A., Myronov, M., Leadley, D.R. |
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| Zdroj: | In Thin Solid Films 2011 519(22):7911-7917 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Shah, V.A., Dobbie, A., Myronov, M., Leadley, D.R. |
|---|---|
| Zdroj: | In Thin Solid Films 2011 519(22):7911-7917 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect