Conductive-atomic force microscopy study of local electron transport in nanostructured titanium nitride thin films
| Autor: | Vasu, K., Krishna, M. Ghanashyam, Padmanabhan, K.A. |
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| Zdroj: | In Thin Solid Films 2011 519(22):7702-7706 |
| Databáze: | ScienceDirect |
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