Formation of CuIn1 − xAlxSe2 thin films studied by Raman scattering

Autor: Olejníček, J., Kamler, C.A., Darveau, S.A., Exstrom, C.L., Slaymaker, L.E., Vandeventer, A.R., Ianno, N.J., Soukup, R.J.
Zdroj: In Thin Solid Films 1 June 2011 519(16):5329-5334
Databáze: ScienceDirect