Spectroellipsometric and ion beam analytical investigation of nanocrystalline diamond layers
| Autor: | Lohner, T., Csíkvári, P., Khánh, N.Q., Dávid, S., Horváth, Z.E., Petrik, P., Hárs, G. |
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| Zdroj: | In Thin Solid Films 28 February 2011 519(9):2806-2810 |
| Databáze: | ScienceDirect |
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