Effects of precursor evaporation temperature on the properties of the yttrium oxide thin films deposited by microwave electron cyclotron resonance plasma assisted metal organic chemical vapor deposition

Autor: Barve, S.A., Jagannath, Mithal, N., Deo, M.N., Biswas, A., Mishra, R., Kishore, R., Bhanage, B.M., Gantayet, L.M., Patil, D.S.
Zdroj: In Thin Solid Films 2011 519(10):3011-3020
Databáze: ScienceDirect